Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2014
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| Online Access: | https://hdl.handle.net/10356/103593 http://hdl.handle.net/10220/19346 |
| _version_ | 1811693395339378688 |
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| author | Tan, Cher Ming Yu, Wen Zhi |
| author2 | School of Electrical and Electronic Engineering |
| author_facet | School of Electrical and Electronic Engineering Tan, Cher Ming Yu, Wen Zhi |
| author_sort | Tan, Cher Ming |
| collection | NTU |
| description | In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure sites before destructive physical analysis of the degraded limiters. |
| first_indexed | 2024-10-01T06:51:00Z |
| format | Journal Article |
| id | ntu-10356/103593 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T06:51:00Z |
| publishDate | 2014 |
| record_format | dspace |
| spelling | ntu-10356/1035932020-03-07T14:00:37Z Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter Tan, Cher Ming Yu, Wen Zhi School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure sites before destructive physical analysis of the degraded limiters. 2014-05-15T06:38:07Z 2019-12-06T21:16:03Z 2014-05-15T06:38:07Z 2019-12-06T21:16:03Z 2014 2014 Journal Article Tan, C. M., & Yu, W. Z. (2014). Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter. Microelectronics Reliability, 54(5), 960-964. 0026-2714 https://hdl.handle.net/10356/103593 http://hdl.handle.net/10220/19346 10.1016/j.microrel.2014.01.009 178878 en Microelectronics reliability © 2014 Elsevier Ltd. |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering Tan, Cher Ming Yu, Wen Zhi Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter |
| title | Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter |
| title_full | Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter |
| title_fullStr | Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter |
| title_full_unstemmed | Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter |
| title_short | Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter |
| title_sort | damage threshold determination and non destructive identification of possible failure sites in pin limiter |
| topic | DRNTU::Engineering::Electrical and electronic engineering |
| url | https://hdl.handle.net/10356/103593 http://hdl.handle.net/10220/19346 |
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