Damage threshold determination and non-destructive identification of possible failure sites in PIN limiter
In this work, we employ a circuit simulation tool to investigate the signature of the change in S-parameters curves with the degradation of PIN limiter circuit parameters. Unique correlations can be established for all the circuit parameters, and this provides a good way to identify possible failure...
Main Authors: | Tan, Cher Ming, Yu, Wen Zhi |
---|---|
Other Authors: | School of Electrical and Electronic Engineering |
Format: | Journal Article |
Language: | English |
Published: |
2014
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/103593 http://hdl.handle.net/10220/19346 |
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