Reliability modeling and assessment of isolated microgrid considering influences of frequency control
Frequency control of isolated microgrid (MG) relies heavily on a safe and reliable cyber system. Random failures of cyber elements may cause the malfunction of the frequency control, resulting in reliability issues, e.g., load shedding or generation curtailment. A reliability modeling and assessment...
Main Authors: | , , , |
---|---|
Other Authors: | |
Format: | Journal Article |
Language: | English |
Published: |
2019
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/106314 http://hdl.handle.net/10220/48925 |
_version_ | 1826129849098436608 |
---|---|
author | Guo, Jing Zhao, Tianyang Liu, Wenxia Zhang, Jianhua |
author2 | Energy Research Institute @ NTU (ERI@N) |
author_facet | Energy Research Institute @ NTU (ERI@N) Guo, Jing Zhao, Tianyang Liu, Wenxia Zhang, Jianhua |
author_sort | Guo, Jing |
collection | NTU |
description | Frequency control of isolated microgrid (MG) relies heavily on a safe and reliable cyber system. Random failures of cyber elements may cause the malfunction of the frequency control, resulting in reliability issues, e.g., load shedding or generation curtailment. A reliability modeling and assessment method for isolated MG is proposed, considering the influence of frequency control from cyber physical system perspectives. The frequency control process is modeled to establish the interdependencies between a cyber system and physical system within MGs. An assessment method is proposed to quantify the impacts of cyber element failures based on the frequency control models. A set of novel reliability index is defined to illustrate impacts of frequency control malfunction on the MG reliability. The sequential Monte Carlo simulation method is adopted to assess the reliability of MGs considering the malfunction of frequency control. The effectiveness of proposed models and indices is demonstrated by the case studies on an isolated MG. The test results indicate that the frequency control malfunction caused by the failures of cyber elements has a great impact on MG reliability. This research can provide technical support for the planning and operation of isolated MGs. |
first_indexed | 2024-10-01T07:47:16Z |
format | Journal Article |
id | ntu-10356/106314 |
institution | Nanyang Technological University |
language | English |
last_indexed | 2024-10-01T07:47:16Z |
publishDate | 2019 |
record_format | dspace |
spelling | ntu-10356/1063142021-01-08T02:45:18Z Reliability modeling and assessment of isolated microgrid considering influences of frequency control Guo, Jing Zhao, Tianyang Liu, Wenxia Zhang, Jianhua Energy Research Institute @ NTU (ERI@N) DRNTU::Engineering::Electrical and electronic engineering Frequency Control Cyber Physical System Frequency control of isolated microgrid (MG) relies heavily on a safe and reliable cyber system. Random failures of cyber elements may cause the malfunction of the frequency control, resulting in reliability issues, e.g., load shedding or generation curtailment. A reliability modeling and assessment method for isolated MG is proposed, considering the influence of frequency control from cyber physical system perspectives. The frequency control process is modeled to establish the interdependencies between a cyber system and physical system within MGs. An assessment method is proposed to quantify the impacts of cyber element failures based on the frequency control models. A set of novel reliability index is defined to illustrate impacts of frequency control malfunction on the MG reliability. The sequential Monte Carlo simulation method is adopted to assess the reliability of MGs considering the malfunction of frequency control. The effectiveness of proposed models and indices is demonstrated by the case studies on an isolated MG. The test results indicate that the frequency control malfunction caused by the failures of cyber elements has a great impact on MG reliability. This research can provide technical support for the planning and operation of isolated MGs. Published version 2019-06-24T07:03:17Z 2019-12-06T22:08:56Z 2019-06-24T07:03:17Z 2019-12-06T22:08:56Z 2019 Journal Article Guo, J., Zhao, T., Liu, W., & Zhang, J. (2019). Reliability modeling and assessment of isolated microgrid considering influences of frequency control. IEEE Access, 7, 50362-50371. doi:10.1109/ACCESS.2019.2909153 https://hdl.handle.net/10356/106314 http://hdl.handle.net/10220/48925 10.1109/ACCESS.2019.2909153 en IEEE Access © 2019 IEEE. Translations and content mining are permitted for academic research only. Personal use is also permitted, but republication/redistribution requires IEEE permission. See http://www.ieee.org/publications_standards/publications/rights/index.html for more information. 10 p. application/pdf |
spellingShingle | DRNTU::Engineering::Electrical and electronic engineering Frequency Control Cyber Physical System Guo, Jing Zhao, Tianyang Liu, Wenxia Zhang, Jianhua Reliability modeling and assessment of isolated microgrid considering influences of frequency control |
title | Reliability modeling and assessment of isolated microgrid considering influences of frequency control |
title_full | Reliability modeling and assessment of isolated microgrid considering influences of frequency control |
title_fullStr | Reliability modeling and assessment of isolated microgrid considering influences of frequency control |
title_full_unstemmed | Reliability modeling and assessment of isolated microgrid considering influences of frequency control |
title_short | Reliability modeling and assessment of isolated microgrid considering influences of frequency control |
title_sort | reliability modeling and assessment of isolated microgrid considering influences of frequency control |
topic | DRNTU::Engineering::Electrical and electronic engineering Frequency Control Cyber Physical System |
url | https://hdl.handle.net/10356/106314 http://hdl.handle.net/10220/48925 |
work_keys_str_mv | AT guojing reliabilitymodelingandassessmentofisolatedmicrogridconsideringinfluencesoffrequencycontrol AT zhaotianyang reliabilitymodelingandassessmentofisolatedmicrogridconsideringinfluencesoffrequencycontrol AT liuwenxia reliabilitymodelingandassessmentofisolatedmicrogridconsideringinfluencesoffrequencycontrol AT zhangjianhua reliabilitymodelingandassessmentofisolatedmicrogridconsideringinfluencesoffrequencycontrol |