Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing
Recent digital technology allows binary patterns to be projected with a very high speed, which shows great potential for high-speed 3D measurement. However, how to retrieve an accurate phase with an even faster speed is still challenging. In this paper, an accurate and efficient phase retrieval tech...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2019
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/106379 http://hdl.handle.net/10220/49601 http://dx.doi.org/10.1117/12.2270064 |
| _version_ | 1811685473848918016 |
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| author | Zheng, Dongliang Kemao, Qian Da, Feipeng Seah, Hock Soon |
| author2 | Lehmann, Peter |
| author_facet | Lehmann, Peter Zheng, Dongliang Kemao, Qian Da, Feipeng Seah, Hock Soon |
| author_sort | Zheng, Dongliang |
| collection | NTU |
| description | Recent digital technology allows binary patterns to be projected with a very high speed, which shows great potential for high-speed 3D measurement. However, how to retrieve an accurate phase with an even faster speed is still challenging. In this paper, an accurate and efficient phase retrieval technique is presented, which combines a Hilbert three-step phaseshifting algorithm with a ternary Gray code-based phase unwrapping method. The Hilbert three-step algorithm uses three squared binary patterns, which can calculate an accurate phase even under a slight defocusing level. The ternary Gray code-based method uses four binary patterns, which can unwrap a phase with a large number of fringe periods. Both simulations and experiments have validated its accuracy and efficiency. |
| first_indexed | 2024-10-01T04:45:05Z |
| format | Journal Article |
| id | ntu-10356/106379 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T04:45:05Z |
| publishDate | 2019 |
| record_format | dspace |
| spelling | ntu-10356/1063792019-12-06T22:10:15Z Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing Zheng, Dongliang Kemao, Qian Da, Feipeng Seah, Hock Soon Lehmann, Peter Osten, Wolfgang Albertazzi Gonçalves, Armando School of Computer Science and Engineering SPIE Optical Metrology Engineering::Computer science and engineering 3D Measurement Projector Defocusing Recent digital technology allows binary patterns to be projected with a very high speed, which shows great potential for high-speed 3D measurement. However, how to retrieve an accurate phase with an even faster speed is still challenging. In this paper, an accurate and efficient phase retrieval technique is presented, which combines a Hilbert three-step phaseshifting algorithm with a ternary Gray code-based phase unwrapping method. The Hilbert three-step algorithm uses three squared binary patterns, which can calculate an accurate phase even under a slight defocusing level. The ternary Gray code-based method uses four binary patterns, which can unwrap a phase with a large number of fringe periods. Both simulations and experiments have validated its accuracy and efficiency. NRF (Natl Research Foundation, S’pore) Published version 2019-08-13T04:22:02Z 2019-12-06T22:10:15Z 2019-08-13T04:22:02Z 2019-12-06T22:10:15Z 2017 Journal Article Zheng, D., Kemao, Q., Da, F., & Seah, H. S. (2017). Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing. Proceedings of SPIE - Optical Measurement Systems for Industrial Inspection X, 10329, 103290V-. doi:10.1117/12.2270064 0277-786X https://hdl.handle.net/10356/106379 http://hdl.handle.net/10220/49601 http://dx.doi.org/10.1117/12.2270064 en Proceedings of SPIE - Optical Measurement Systems for Industrial Inspection X © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Optical Measurement Systems for Industrial Inspection X and is made available with permission of SPIE. 6 p. application/pdf |
| spellingShingle | Engineering::Computer science and engineering 3D Measurement Projector Defocusing Zheng, Dongliang Kemao, Qian Da, Feipeng Seah, Hock Soon Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing |
| title | Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing |
| title_full | Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing |
| title_fullStr | Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing |
| title_full_unstemmed | Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing |
| title_short | Phase retrieval for high-speed 3D measurement using binary patterns with projector defocusing |
| title_sort | phase retrieval for high speed 3d measurement using binary patterns with projector defocusing |
| topic | Engineering::Computer science and engineering 3D Measurement Projector Defocusing |
| url | https://hdl.handle.net/10356/106379 http://hdl.handle.net/10220/49601 http://dx.doi.org/10.1117/12.2270064 |
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