Instrument transfer function for digital holography system
Digital holography system can quantitatively obtain the microscopic appearance of the measured surface, with non-contact, high precision, large measuring range, etc. Among the varies of characterizing a system, Instrument Transfer Function (ITF) is the most appealing method, which can describe the s...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2019
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| Online Access: | https://hdl.handle.net/10356/106847 http://hdl.handle.net/10220/49659 |
| _version_ | 1826120215295950848 |
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| author | Asundi, Anand Krishna Yu, Yingjie Sun, Tao |
| author2 | Asundi, Anand K. |
| author_facet | Asundi, Anand K. Asundi, Anand Krishna Yu, Yingjie Sun, Tao |
| author_sort | Asundi, Anand Krishna |
| collection | NTU |
| description | Digital holography system can quantitatively obtain the microscopic appearance of the measured surface, with non-contact, high precision, large measuring range, etc. Among the varies of characterizing a system, Instrument Transfer Function (ITF) is the most appealing method, which can describe the system response in terms of an input signal’s frequency content. In this paper, we proposed a method to calculate the system transfer function of digital holography system for measure a high quality phase step, which contains all spatial frequencies. The ITF can be calculated across all frequencies with a single measurement by comparing the Power spectral Density (PSD) of a measured step to the theoretical PSD. The method is applied to calculate the ITF of digital holography system. Experimental result shows that the ITF of the digital holography system is above 60%.The result shows that the ITF of digital holography system could be kept at acceptable levels within the range of interest. |
| first_indexed | 2024-10-01T05:12:52Z |
| format | Journal Article |
| id | ntu-10356/106847 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:12:52Z |
| publishDate | 2019 |
| record_format | dspace |
| spelling | ntu-10356/1068472023-03-04T17:21:45Z Instrument transfer function for digital holography system Asundi, Anand Krishna Yu, Yingjie Sun, Tao Asundi, Anand K. School of Mechanical and Aerospace Engineering Fifth International Conference on Optical and Photonics Engineering Instrument Transfer Function Digital Holography Engineering::Mechanical engineering Digital holography system can quantitatively obtain the microscopic appearance of the measured surface, with non-contact, high precision, large measuring range, etc. Among the varies of characterizing a system, Instrument Transfer Function (ITF) is the most appealing method, which can describe the system response in terms of an input signal’s frequency content. In this paper, we proposed a method to calculate the system transfer function of digital holography system for measure a high quality phase step, which contains all spatial frequencies. The ITF can be calculated across all frequencies with a single measurement by comparing the Power spectral Density (PSD) of a measured step to the theoretical PSD. The method is applied to calculate the ITF of digital holography system. Experimental result shows that the ITF of the digital holography system is above 60%.The result shows that the ITF of digital holography system could be kept at acceptable levels within the range of interest. Published version 2019-08-15T07:03:24Z 2019-12-06T22:19:38Z 2019-08-15T07:03:24Z 2019-12-06T22:19:38Z 2017 Journal Article Sun, T., Asundi, A. K., & Yu, Y. (2017). Instrument transfer function for digital holography system. Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering, 10449, 104491D-. doi:10.1117/12.2270644 0277-786X https://hdl.handle.net/10356/106847 http://hdl.handle.net/10220/49659 10.1117/12.2270644 en Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering © 2017 SPIE. All rights reserved. This paper was published in Proceedings of SPIE - Fifth International Conference on Optical and Photonics Engineering and is made available with permission of SPIE. 7 p. application/pdf |
| spellingShingle | Instrument Transfer Function Digital Holography Engineering::Mechanical engineering Asundi, Anand Krishna Yu, Yingjie Sun, Tao Instrument transfer function for digital holography system |
| title | Instrument transfer function for digital holography system |
| title_full | Instrument transfer function for digital holography system |
| title_fullStr | Instrument transfer function for digital holography system |
| title_full_unstemmed | Instrument transfer function for digital holography system |
| title_short | Instrument transfer function for digital holography system |
| title_sort | instrument transfer function for digital holography system |
| topic | Instrument Transfer Function Digital Holography Engineering::Mechanical engineering |
| url | https://hdl.handle.net/10356/106847 http://hdl.handle.net/10220/49659 |
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