Descrambling of embedded SRAM using a laser probe
Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for conte...
| Principais autores: | , , , , , , |
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| Outros Autores: | |
| Formato: | Conference Paper |
| Idioma: | English |
| Publicado em: |
2019
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| Assuntos: | |
| Acesso em linha: | https://hdl.handle.net/10356/107598 http://hdl.handle.net/10220/50353 |
| Resumo: | Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for content estimation or encryption key recovery, with several techniques being reported for this task. In this paper, we discuss the application of laser probing for descrambling memory embedded in 8 bits microcontrollers designed and manufactured by different companies in various technology nodes. |
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