Descrambling of embedded SRAM using a laser probe
Understanding the organization of memory is a mandatory first step in various fields of applications such as failure analysis, defect localization, qualification and testing of space electronics, and security evaluation. For the last category, localization of specific addresses may be used for conte...
| Main Authors: | , , , , , , |
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| Other Authors: | |
| Format: | Conference Paper |
| Language: | English |
| Published: |
2019
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/107598 http://hdl.handle.net/10220/50353 |