Path oriented boolean test generation for single stuck-at fault in combinational circuits

Path oriented boolean test generation for single stuck-at fault in combinational circuits

To produce reliable electronic systems, defect-free components must be available. Automatic test pattern generation systems distinguish defective components from defect-free components by generating input sets that cause the outputs of a component under test to be different if the component is defec...

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Bibliographic Details
Main Author: Zhang, Xudong
Other Authors: Chin, Edward Hsi Ling
Format: Thesis
Language:English
Published: 2008
Subjects:
DRNTU::Engineering::Electrical and electronic engineering::Electronic circuits
DRNTU::Engineering::Computer science and engineering::Theory of computation::Analysis of algorithms and problem complexity
Online Access:http://hdl.handle.net/10356/13164
Description
Summary:To produce reliable electronic systems, defect-free components must be available. Automatic test pattern generation systems distinguish defective components from defect-free components by generating input sets that cause the outputs of a component under test to be different if the component is defective than if it is defect-free. As the logic circuits under test get larger, generating tests is becoming harder. Test generation has been proved to be a NP-complete problem.

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