Characterisation of amorphous carbon films deposited using ECR-CVD

Hydrogenated diamond-like carbon (DLC) films have received a considerable amount of interest recently due to their unique characteristics such as chemical stability, mechanical hardness and high optical transparency. Among different deposition methods, the electron cyclotron resonance chemical vapou...

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Bibliographic Details
Main Author: Wu, Yangsheng.
Other Authors: Yoon, Soon Fatt
Format: Thesis
Language:English
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/13268
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author Wu, Yangsheng.
author2 Yoon, Soon Fatt
author_facet Yoon, Soon Fatt
Wu, Yangsheng.
author_sort Wu, Yangsheng.
collection NTU
description Hydrogenated diamond-like carbon (DLC) films have received a considerable amount of interest recently due to their unique characteristics such as chemical stability, mechanical hardness and high optical transparency. Among different deposition methods, the electron cyclotron resonance chemical vapour deposition (ECR-CVD) technique has been increasingly used for the growth of DLC films due to its capable of producing a highly excited plasma with greater efficiency in the breaking of the C-H bonds in the reactant gas mixture.
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spelling ntu-10356/132682023-07-04T15:30:05Z Characterisation of amorphous carbon films deposited using ECR-CVD Wu, Yangsheng. Yoon, Soon Fatt School of Electrical and Electronic Engineering DRNTU::Engineering::Materials::Microelectronics and semiconductor materials Hydrogenated diamond-like carbon (DLC) films have received a considerable amount of interest recently due to their unique characteristics such as chemical stability, mechanical hardness and high optical transparency. Among different deposition methods, the electron cyclotron resonance chemical vapour deposition (ECR-CVD) technique has been increasingly used for the growth of DLC films due to its capable of producing a highly excited plasma with greater efficiency in the breaking of the C-H bonds in the reactant gas mixture. Master of Engineering 2008-10-20T07:22:22Z 2008-10-20T07:22:22Z 1999 1999 Thesis http://hdl.handle.net/10356/13268 en 98 p. application/pdf
spellingShingle DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
Wu, Yangsheng.
Characterisation of amorphous carbon films deposited using ECR-CVD
title Characterisation of amorphous carbon films deposited using ECR-CVD
title_full Characterisation of amorphous carbon films deposited using ECR-CVD
title_fullStr Characterisation of amorphous carbon films deposited using ECR-CVD
title_full_unstemmed Characterisation of amorphous carbon films deposited using ECR-CVD
title_short Characterisation of amorphous carbon films deposited using ECR-CVD
title_sort characterisation of amorphous carbon films deposited using ecr cvd
topic DRNTU::Engineering::Materials::Microelectronics and semiconductor materials
url http://hdl.handle.net/10356/13268
work_keys_str_mv AT wuyangsheng characterisationofamorphouscarbonfilmsdepositedusingecrcvd