One class based feature learning approach for defect detection using deep autoencoders
Detecting defects is an integral part of any manufacturing process. Most works still utilize traditional image processing algorithms to detect defects owing to the complexity and variety of products and manufacturing environments. In this paper, we propose an approach based on deep learning which us...
| Main Authors: | , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2020
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/137979 |