Multi-trap energy states in GaN HEMTs : characterization and modeling
In this work, presence of multi-trap energy (MTE) levels in the GaN energy bandgap of AlGaN/GaN HEMT is studied based on conductance method as well as temperature-dependent current transient measurements. Using conductance method, it is observed that the MTE model shows a better fit with the measure...
Main Authors: | Binit Syamal, Zhou, Xing, Chiah, Siau Ben |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Conference Paper |
Language: | English |
Published: |
2020
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/139024 |
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