Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses

Nanoionic device-based artificial neural networks that consume little power and hold a potential for enormous densities still fall behind the capabilities of software algorithms running on traditional von Neumann machines. In addition, despite many publications showing multilevel parametric capabili...

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Main Authors: Berco, Dan, Ang, Diing Shenp
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2020
Subjects:
Online Access:https://hdl.handle.net/10356/141472
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author Berco, Dan
Ang, Diing Shenp
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Berco, Dan
Ang, Diing Shenp
author_sort Berco, Dan
collection NTU
description Nanoionic device-based artificial neural networks that consume little power and hold a potential for enormous densities still fall behind the capabilities of software algorithms running on traditional von Neumann machines. In addition, despite many publications showing multilevel parametric capabilities associated with these devices, a real-world nonvolatile memory application that maximizes their potential density is yet to be realized. One reason may be due to their limited functional mode as an analog passive element that is crippled by large interdevice variations. This work demonstrates that the nanoscale stoichiometry in transition metal oxides can be triggered to form asymmetric cationlike vacancy distributions that yield dynamically toggled current rectifying properties. In this manner, a rectifying device operated as an artificial synapse is capable of switching between excitatory and inhibitory modes, dissipating ∼20 fJ/switching event. This complementary functionality (in a similar manner to CMOS transistors) adds a whole new degree of freedom to the design of neuromorphic computing platforms. Moreover, the entire spectrum of nonvolatile states derived from different cation distributions (positive-rectifying, negative-rectifying, conductive, and insulating) may be considered as a mutually exclusive and interchangeable basis set for robust multilevel memory implementation that overcomes the issues associated with large process and device related parametric distributions.
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spelling ntu-10356/1414722020-07-07T01:20:02Z Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses Berco, Dan Ang, Diing Shenp School of Electrical and Electronic Engineering Engineering::Electrical and electronic engineering Nanoionics Ions and Properties Nanoionic device-based artificial neural networks that consume little power and hold a potential for enormous densities still fall behind the capabilities of software algorithms running on traditional von Neumann machines. In addition, despite many publications showing multilevel parametric capabilities associated with these devices, a real-world nonvolatile memory application that maximizes their potential density is yet to be realized. One reason may be due to their limited functional mode as an analog passive element that is crippled by large interdevice variations. This work demonstrates that the nanoscale stoichiometry in transition metal oxides can be triggered to form asymmetric cationlike vacancy distributions that yield dynamically toggled current rectifying properties. In this manner, a rectifying device operated as an artificial synapse is capable of switching between excitatory and inhibitory modes, dissipating ∼20 fJ/switching event. This complementary functionality (in a similar manner to CMOS transistors) adds a whole new degree of freedom to the design of neuromorphic computing platforms. Moreover, the entire spectrum of nonvolatile states derived from different cation distributions (positive-rectifying, negative-rectifying, conductive, and insulating) may be considered as a mutually exclusive and interchangeable basis set for robust multilevel memory implementation that overcomes the issues associated with large process and device related parametric distributions. MOE (Min. of Education, S’pore) Published version 2020-06-08T10:08:01Z 2020-06-08T10:08:01Z 2019 Journal Article Berco, D., & Ang, D. A. (2019). Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses. Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics, 37(6), 061806-. doi:10.1116/1.5123665 2166-2746 https://hdl.handle.net/10356/141472 10.1116/1.5123665 2-s2.0-85073369134 6 37 061806-1 061806-10 en Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics © 2019 The Author(s). All rights reserved. This paper was published by the AVS in Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics and is made available with permission of The Author(s). application/pdf
spellingShingle Engineering::Electrical and electronic engineering
Nanoionics
Ions and Properties
Berco, Dan
Ang, Diing Shenp
Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses
title Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses
title_full Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses
title_fullStr Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses
title_full_unstemmed Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses
title_short Inducing alternating nanoscale rectification in a dielectric material for bidirectional-trigger artificial synapses
title_sort inducing alternating nanoscale rectification in a dielectric material for bidirectional trigger artificial synapses
topic Engineering::Electrical and electronic engineering
Nanoionics
Ions and Properties
url https://hdl.handle.net/10356/141472
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