Automatic localization of signal sources in photon emission images for integrated circuit analysis

Automatic localization of signal sources in photon emission images for integrated circuit analysis

Defects localization is a key step in failure analysis of highly scaled complementary oxide semiconductor integrated circuits (ICs). It gives prior information on VLSI circuits and allows the designers to improve their diagnostic. Light emission techniques are efficient to localize defects in modern...

书目详细资料
Main Authors:	Boscaro, Anthony, Jacquir, Sabir, Chef, Samuel, Sanchez, Kevin, Perdu, Philippe, Binczak, Stéphane
其他作者:	Temasek Laboratories
格式:	Journal Article
语言:	English
出版:	2020
主题:	Science::Physics Photon Emission Microelectronics Reliability
在线阅读:	https://hdl.handle.net/10356/141803

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