Thickness-dependent microstructural properties of heteroepitaxial (00.1) CuFeO2 thin films on (00.1) sapphire by pulsed laser deposition

Thickness-dependent microstructural properties of heteroepitaxial (00.1) CuFeO2 thin films on (00.1) sapphire by pulsed laser deposition

Typical low-temperature frustrated triangular antiferromagnet CuFeO2 is attracting extensive interest due to its narrow-band-gap semiconductor properties. High-quality and impurity-free CuFeO2 epitaxial thin films would be preferable for fundamental studies on the physical and chemical properties. H...

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Bibliographic Details
Main Authors: Luo, Sijun, Fluri, Aline, Zhang, Song, Liu, Xue, Döbeli, Max, Harrington, George F., Tu, Rong, Pergolesi, Daniele, Ishihara, Tasumi, Lippert, Thomas
Other Authors: School of Physical and Mathematical Sciences
Format: Journal Article
Language:English
Published: 2020
Subjects:
Science::Physics
CuFeO2
Thin Films
Online Access:https://hdl.handle.net/10356/143947

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