A reliable physical unclonable function based on differential charging capacitors
Physical Unclonable Function (PUF) is an emerging security primitive for cryptography applications. However, achieving a very high reliability against the environmental variations remains a main challenge in PUF design and a key barrier for its commercialization. This paper presents a new PUF design...
| Main Authors: | , , , , , , , , , |
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| Other Authors: | |
| Format: | Conference Paper |
| Language: | English |
| Published: |
2021
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| Online Access: | https://hdl.handle.net/10356/145852 |
| _version_ | 1826121917919133696 |
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| author | Yuan, Hang Guo, Wei Chang, Chip-Hong Cao, Yuan Wei, Shaojun Yin, Shouyi Deng, Chenchen Liu, Leibo Ge, Wei Zhang, Fan |
| author2 | School of Electrical and Electronic Engineering |
| author_facet | School of Electrical and Electronic Engineering Yuan, Hang Guo, Wei Chang, Chip-Hong Cao, Yuan Wei, Shaojun Yin, Shouyi Deng, Chenchen Liu, Leibo Ge, Wei Zhang, Fan |
| author_sort | Yuan, Hang |
| collection | NTU |
| description | Physical Unclonable Function (PUF) is an emerging security primitive for cryptography applications. However, achieving a very high reliability against the environmental variations remains a main challenge in PUF design and a key barrier for its commercialization. This paper presents a new PUF design based on the charging of a symmetric MOS capacitor pair by constant current with cross-coupled positive feedback inverters. The proposed weak PUF features high raw response reliability against variations in power supply and temperature without power-up reset noise and other issues due to the power-down and up of an array of cells. Extensive Monte-Carlo simulations have been performed using a standard 110nm CMOS process technology. The simulated results show an almost ideal uniqueness of 50.03% and superior reliability of 97.70% over a temperature range from 0 ̊C to 80 ̊C, and 96.20% with the supply voltage varies from 1.2 V to 1.8 V. The response bit can be generated at a rate of 27.78 Mbps with an average power consumption of 20.86 μW at 1.5V, and the energy consumption is only 750 fJ/bit. |
| first_indexed | 2024-10-01T05:40:00Z |
| format | Conference Paper |
| id | ntu-10356/145852 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:40:00Z |
| publishDate | 2021 |
| record_format | dspace |
| spelling | ntu-10356/1458522021-01-12T02:51:28Z A reliable physical unclonable function based on differential charging capacitors Yuan, Hang Guo, Wei Chang, Chip-Hong Cao, Yuan Wei, Shaojun Yin, Shouyi Deng, Chenchen Liu, Leibo Ge, Wei Zhang, Fan School of Electrical and Electronic Engineering 2019 IEEE International Symposium on Circuits and Systems (ISCAS) Centre for Integrated Circuits and Systems Engineering::Electrical and electronic engineering Reliability Capacitors Physical Unclonable Function (PUF) is an emerging security primitive for cryptography applications. However, achieving a very high reliability against the environmental variations remains a main challenge in PUF design and a key barrier for its commercialization. This paper presents a new PUF design based on the charging of a symmetric MOS capacitor pair by constant current with cross-coupled positive feedback inverters. The proposed weak PUF features high raw response reliability against variations in power supply and temperature without power-up reset noise and other issues due to the power-down and up of an array of cells. Extensive Monte-Carlo simulations have been performed using a standard 110nm CMOS process technology. The simulated results show an almost ideal uniqueness of 50.03% and superior reliability of 97.70% over a temperature range from 0 ̊C to 80 ̊C, and 96.20% with the supply voltage varies from 1.2 V to 1.8 V. The response bit can be generated at a rate of 27.78 Mbps with an average power consumption of 20.86 μW at 1.5V, and the energy consumption is only 750 fJ/bit. Ministry of Education (MOE) Accepted version The authors would like to acknowledge the support of the the Singapore Ministry of Education Tier 1 Grant MOE2018- T1-001-131 (RG87/18), National Natural Science Foundation of China (61601168), Natural Science Foundation of Jiangsu Province (BK20170205), and the Major Scientific Research Project of Zhejiang Lab (Grant No. 2018FD0ZX01). 2021-01-12T02:48:52Z 2021-01-12T02:48:52Z 2019 Conference Paper Yuan, H., Guo, W., Chang, C.-H., Cao, Y., Wei, S., Yin, S., ... Zhang, F. (2019). A reliable physical unclonable function based on differential charging capacitors. Proceedings of the 2019 IEEE International Symposium on Circuits and Systems (ISCAS). doi:10.1109/ISCAS.2019.8702728 978-1-7281-0397-6 https://hdl.handle.net/10356/145852 10.1109/ISCAS.2019.8702728 1 5 en MOE2018-T1-001-131 (RG87/18) © 2019 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in any current or future media, including reprinting/republishing this material for advertising or promotional purposes, creating new collective works, for resale or redistribution to servers or lists, or reuse of any copyrighted component of this work in other works. The published version is available at: https://doi.org/10.1109/ISCAS.2019.8702728 application/pdf |
| spellingShingle | Engineering::Electrical and electronic engineering Reliability Capacitors Yuan, Hang Guo, Wei Chang, Chip-Hong Cao, Yuan Wei, Shaojun Yin, Shouyi Deng, Chenchen Liu, Leibo Ge, Wei Zhang, Fan A reliable physical unclonable function based on differential charging capacitors |
| title | A reliable physical unclonable function based on differential charging capacitors |
| title_full | A reliable physical unclonable function based on differential charging capacitors |
| title_fullStr | A reliable physical unclonable function based on differential charging capacitors |
| title_full_unstemmed | A reliable physical unclonable function based on differential charging capacitors |
| title_short | A reliable physical unclonable function based on differential charging capacitors |
| title_sort | reliable physical unclonable function based on differential charging capacitors |
| topic | Engineering::Electrical and electronic engineering Reliability Capacitors |
| url | https://hdl.handle.net/10356/145852 |
| work_keys_str_mv | AT yuanhang areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT guowei areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT changchiphong areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT caoyuan areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT weishaojun areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT yinshouyi areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT dengchenchen areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT liuleibo areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT gewei areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT zhangfan areliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT yuanhang reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT guowei reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT changchiphong reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT caoyuan reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT weishaojun reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT yinshouyi reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT dengchenchen reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT liuleibo reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT gewei reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors AT zhangfan reliablephysicalunclonablefunctionbasedondifferentialchargingcapacitors |