Deep Learning-based image analysis framework for hardware assurance of digital integrated circuits
We propose an Artificial Intelligence (AI)/Deep Learning (DL)-based image analysis framework for hardware assurance of digital integrated circuits (ICs). Our aim is to examine and verify various hardware information from analyzing the Scanning Electron Microscope (SEM) images of an IC. In our propos...
Main Authors: | , , , , , , |
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Other Authors: | |
Format: | Conference Paper |
Language: | English |
Published: |
2021
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/147091 |