Deep Learning-based image analysis framework for hardware assurance of digital integrated circuits

Deep Learning-based image analysis framework for hardware assurance of digital integrated circuits

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We propose an Artificial Intelligence (AI)/Deep Learning (DL)-based image analysis framework for hardware assurance of digital integrated circuits (ICs). Our aim is to examine and verify various hardware information from analyzing the Scanning Electron Microscope (SEM) images of an IC. In our propos...

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Bibliographic Details
Main Authors: Lin, Tong, Shi, Yiqiong, Shu, Na, Cheng, Deruo, Hong, Xuenong, Song, Jingsi, Gwee, Bah Hwee
Other Authors: School of Electrical and Electronic Engineering
Format: Conference Paper
Language:English
Published: 2021
Subjects:
Engineering::Electrical and electronic engineering
Integrated Circuit Modeling
Hardware
Online Access:https://hdl.handle.net/10356/147091
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