Stability study of non-volatile memory content under different temperature conditions
Non-Volatile Memory (NVM) devices store data in floating gates in binary form with electrical charges. Continuous improvement of device technology has led to a reduction in size of the transistors over the years. In this report, experiments were carried out to determine the temperature at which the...
| Main Author: | |
|---|---|
| Other Authors: | |
| Format: | Final Year Project (FYP) |
| Language: | English |
| Published: |
Nanyang Technological University
2021
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/147720 |