Defect engineering in two common types of dielectric materials for electromagnetic absorption applications
Dielectric materials are greatly desired for electromagnetic absorption applications. Lots of research shows that conduction loss and polarization are two of the most important factors determining complex permittivity. However, the detailed dissipation mechanisms for the improved microwave absorptio...
| Main Authors: | , , , , , , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2021
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/150215 |
| _version_ | 1811688329477881856 |
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| author | Quan, Bin Shi, Wenhao Ong, Samuel Jun Hoong Lu, Xiaochi Wang, Paul Luyuan Ji, Guangbin Guo , Yufeng Zheng, Lirong Xu, Zhichuan Jason |
| author2 | School of Materials Science and Engineering |
| author_facet | School of Materials Science and Engineering Quan, Bin Shi, Wenhao Ong, Samuel Jun Hoong Lu, Xiaochi Wang, Paul Luyuan Ji, Guangbin Guo , Yufeng Zheng, Lirong Xu, Zhichuan Jason |
| author_sort | Quan, Bin |
| collection | NTU |
| description | Dielectric materials are greatly desired for electromagnetic absorption applications. Lots of research shows that conduction loss and polarization are two of the most important factors determining complex permittivity. However, the detailed dissipation mechanisms for the improved microwave absorption performance are often based on semiempirical rules, lacking practical data relationships between conduction loss/polarization and dielectric behaviors. Here, a strategy of introducing point defects is used to understand such underlying relationships, where polarizability and conductivity are adjustable by manipulating oxygen deficiency or heteroatoms. Based on first principles calculations and the applied oxygen-deficient strategy, dielectric polarization is shown to be dominant in determining the permittivity behaviors in semiconductors. Meanwhile, the presented nitrogen doping strategy shows that conduction loss is dominant in determining the permittivity behavior in graphitized carbon materials. The validity of the methods for using point defects to explore the underlying relations between conduction loss/polarization and dielectric behaviors in semiconductor and graphitized carbon are demonstrated for the first time, which are of great importance in optimizing the microwave absorption performance by defect engineering and electronic structure tailoring. |
| first_indexed | 2024-10-01T05:30:29Z |
| format | Journal Article |
| id | ntu-10356/150215 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:30:29Z |
| publishDate | 2021 |
| record_format | dspace |
| spelling | ntu-10356/1502152021-06-01T01:08:39Z Defect engineering in two common types of dielectric materials for electromagnetic absorption applications Quan, Bin Shi, Wenhao Ong, Samuel Jun Hoong Lu, Xiaochi Wang, Paul Luyuan Ji, Guangbin Guo , Yufeng Zheng, Lirong Xu, Zhichuan Jason School of Materials Science and Engineering Engineering::Materials Complex Permittivity Conduction Loss Dielectric materials are greatly desired for electromagnetic absorption applications. Lots of research shows that conduction loss and polarization are two of the most important factors determining complex permittivity. However, the detailed dissipation mechanisms for the improved microwave absorption performance are often based on semiempirical rules, lacking practical data relationships between conduction loss/polarization and dielectric behaviors. Here, a strategy of introducing point defects is used to understand such underlying relationships, where polarizability and conductivity are adjustable by manipulating oxygen deficiency or heteroatoms. Based on first principles calculations and the applied oxygen-deficient strategy, dielectric polarization is shown to be dominant in determining the permittivity behaviors in semiconductors. Meanwhile, the presented nitrogen doping strategy shows that conduction loss is dominant in determining the permittivity behavior in graphitized carbon materials. The validity of the methods for using point defects to explore the underlying relations between conduction loss/polarization and dielectric behaviors in semiconductor and graphitized carbon are demonstrated for the first time, which are of great importance in optimizing the microwave absorption performance by defect engineering and electronic structure tailoring. Financial supports from the NSFC (Grant Nos. 11575085, 51602154, 11472131, and 11622218), the Aeronautics Science Foundation of China (Grant No. 2017ZF52066), the Qing Lan Project, Six talent peaks project in Jiangsu Province (Project No. XCL-035), the Jiangsu NSF (BK20160037), the program of China Scholarships Council (Grant No. 201806830013), Funding for Outstanding Doctoral Dissertation in NUAA (BCXJ 18-07), the Open Research Fund of Jiangsu Provincial Key Laboratory for Nanotechnology of Nanjing University, and the Priority Academic Program Development of Jiangsu Higher Education Institutions (PAPD) are gratefully acknowledged. 2021-06-01T01:08:39Z 2021-06-01T01:08:39Z 2019 Journal Article Quan, B., Shi, W., Ong, S. J. H., Lu, X., Wang, P. L., Ji, G., Guo , Y., Zheng, L. & Xu, Z. J. (2019). Defect engineering in two common types of dielectric materials for electromagnetic absorption applications. Advanced Functional Materials, 29(28), 1901236-. https://dx.doi.org/10.1002/adfm.201901236 1616-301X 0000-0001-7746-5920 https://hdl.handle.net/10356/150215 10.1002/adfm.201901236 2-s2.0-85065472615 28 29 1901236 en Advanced Functional Materials © 2019 Wiley-VCH Verlag GmbH & Co. KGaA, Weinheim. All rights reserved. |
| spellingShingle | Engineering::Materials Complex Permittivity Conduction Loss Quan, Bin Shi, Wenhao Ong, Samuel Jun Hoong Lu, Xiaochi Wang, Paul Luyuan Ji, Guangbin Guo , Yufeng Zheng, Lirong Xu, Zhichuan Jason Defect engineering in two common types of dielectric materials for electromagnetic absorption applications |
| title | Defect engineering in two common types of dielectric materials for electromagnetic absorption applications |
| title_full | Defect engineering in two common types of dielectric materials for electromagnetic absorption applications |
| title_fullStr | Defect engineering in two common types of dielectric materials for electromagnetic absorption applications |
| title_full_unstemmed | Defect engineering in two common types of dielectric materials for electromagnetic absorption applications |
| title_short | Defect engineering in two common types of dielectric materials for electromagnetic absorption applications |
| title_sort | defect engineering in two common types of dielectric materials for electromagnetic absorption applications |
| topic | Engineering::Materials Complex Permittivity Conduction Loss |
| url | https://hdl.handle.net/10356/150215 |
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