Building an intelligent e-diagnostics system for reducing mean time to repair (MTTR) of wire bond machines
In today's cost driven semiconductor industry, utilizing the available capacity to its maximum limits is of prime importance for being competitive. With the equipments being expensive and the technology changing very fast, utilization of the available resources, by minimizing the repair time b...
| Main Authors: | , , |
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| Other Authors: | |
| Format: | Thesis |
| Language: | English |
| Published: |
2009
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| Subjects: | |
| Online Access: | http://hdl.handle.net/10356/15186 |