Measuring crystal orientation from etched surfaces via directional reflectance microscopy
Mapping crystal orientation has always been the domain of diffraction-based techniques. However, these measurements have limited throughput and require specialized equipment. In this work, we demonstrate crystal orientation mapping on chemically etched aluminum samples using a simple and inexpensive...
| Main Authors: | , , , , |
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| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2021
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/153633 |
| _version_ | 1811682090069000192 |
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| author | Wang, Xiaogang Gao, Shubo Jain, Ekta Gaskey, Bernard Seita, Matteo |
| author2 | School of Mechanical and Aerospace Engineering |
| author_facet | School of Mechanical and Aerospace Engineering Wang, Xiaogang Gao, Shubo Jain, Ekta Gaskey, Bernard Seita, Matteo |
| author_sort | Wang, Xiaogang |
| collection | NTU |
| description | Mapping crystal orientation has always been the domain of diffraction-based techniques. However, these measurements have limited throughput and require specialized equipment. In this work, we demonstrate crystal orientation mapping on chemically etched aluminum samples using a simple and inexpensive optical technique called directional reflectance microscopy (DRM). DRM quantifies surface reflectance as a function of illumination angle. We identify directional reflectance characteristics of grains with (111) out-of-plane orientation and infer their surface topography to calculate their underlying crystal orientation. We confirm the surface topography using atomic force microscopy and validate DRM orientation measurements with electron backscatter diffraction. |
| first_indexed | 2024-10-01T03:51:18Z |
| format | Journal Article |
| id | ntu-10356/153633 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T03:51:18Z |
| publishDate | 2021 |
| record_format | dspace |
| spelling | ntu-10356/1536332023-02-28T16:40:12Z Measuring crystal orientation from etched surfaces via directional reflectance microscopy Wang, Xiaogang Gao, Shubo Jain, Ekta Gaskey, Bernard Seita, Matteo School of Mechanical and Aerospace Engineering School of Materials Science and Engineering Asian School of the Environment Engineering::Materials Diffraction Mapping Mapping crystal orientation has always been the domain of diffraction-based techniques. However, these measurements have limited throughput and require specialized equipment. In this work, we demonstrate crystal orientation mapping on chemically etched aluminum samples using a simple and inexpensive optical technique called directional reflectance microscopy (DRM). DRM quantifies surface reflectance as a function of illumination angle. We identify directional reflectance characteristics of grains with (111) out-of-plane orientation and infer their surface topography to calculate their underlying crystal orientation. We confirm the surface topography using atomic force microscopy and validate DRM orientation measurements with electron backscatter diffraction. Ministry of Education (MOE) Published version This research was funded by Ministry of Education of Singapore, Official Number: MOE2017-T2-2-119. 2021-12-07T08:02:41Z 2021-12-07T08:02:41Z 2020 Journal Article Wang, X., Gao, S., Jain, E., Gaskey, B. & Seita, M. (2020). Measuring crystal orientation from etched surfaces via directional reflectance microscopy. Journal of Materials Science, 55(25), 11669-11678. https://dx.doi.org/10.1007/s10853-020-04734-z 0022-2461 https://hdl.handle.net/10356/153633 10.1007/s10853-020-04734-z 2-s2.0-85085136874 25 55 11669 11678 en MOE2017-T2-2-119 Journal of Materials Science © 2020 The Author(s). This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons licence, and indicate if changes were made. application/pdf |
| spellingShingle | Engineering::Materials Diffraction Mapping Wang, Xiaogang Gao, Shubo Jain, Ekta Gaskey, Bernard Seita, Matteo Measuring crystal orientation from etched surfaces via directional reflectance microscopy |
| title | Measuring crystal orientation from etched surfaces via directional reflectance microscopy |
| title_full | Measuring crystal orientation from etched surfaces via directional reflectance microscopy |
| title_fullStr | Measuring crystal orientation from etched surfaces via directional reflectance microscopy |
| title_full_unstemmed | Measuring crystal orientation from etched surfaces via directional reflectance microscopy |
| title_short | Measuring crystal orientation from etched surfaces via directional reflectance microscopy |
| title_sort | measuring crystal orientation from etched surfaces via directional reflectance microscopy |
| topic | Engineering::Materials Diffraction Mapping |
| url | https://hdl.handle.net/10356/153633 |
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