Uncovering the indium filament revolution in transparent bipolar ito/siox/ito resistive switching memories
Transparent resistive switching random access memory (ReRAM) is of interest for the future integrated invisible circuitry. However, poor understanding of its working mechanism in transparent ReRAMs with the indium tin oxide (ITO) electrode is still a critical problem and will hinder its widespread a...
Main Authors: | Qian, Kai, Han, Xu, Li, Huakai, Chen, Tupei, Lee, Pooi See |
---|---|
Other Authors: | School of Electrical and Electronic Engineering |
Format: | Journal Article |
Language: | English |
Published: |
2022
|
Subjects: | |
Online Access: | https://hdl.handle.net/10356/155166 |
Similar Items
-
Digital ReRAM-based compute-in-memory design
by: Xu, Jiawei
Published: (2024) -
Crossbar-constrained technology mapping for ReRAM based in-memory computing
by: Bhattacharjee, Debjyoti, et al.
Published: (2021) -
Cation-based memristors for memory and non-conventional computing applications
by: Lee, Calvin Xiu Xian
Published: (2025) -
Multi-valued and fuzzy logic realization using TaOx memristive devices
by: Bhattacharjee, Debjyoti, et al.
Published: (2018) -
Enhancement in performance and reliability of transparent IGZO thin-film transistors by ITO/Ti stacked source/drain contacts
by: Li, Yuanbo, et al.
Published: (2024)