A data-driven method for IGBT open-circuit fault diagnosis based on hybrid ensemble learning and sliding-window classification
In this article, a novel data-driven method is proposed for open-circuit fault diagnosis of insulated gate bipolar transistor used in three-phase pulsewidth modulation converter. Based on the sampled three-phase current signals, fast Fourier transform and ReliefF algorithm are used to select most co...
Main Authors: | Xia, Yang, Xu, Yan, Gou, Bin |
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Other Authors: | School of Electrical and Electronic Engineering |
Format: | Journal Article |
Language: | English |
Published: |
2022
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/155302 |
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