Defect characterization of materials' surface using Python
Gallium nitride semiconductor (GaN) has become popular over the past few years. GaN based devices can be found in a charger, electric vehicles, and the latest 5G network. GaN layer could be grown on a different substrate such as Silicon (Si) and Silicon Carbide (SiC). However, growing GaN on diffe...
Main Author: | Teo, Jack |
---|---|
Other Authors: | Radhakrishnan K |
Format: | Final Year Project (FYP) |
Language: | English |
Published: |
Nanyang Technological University
2022
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/157414 |
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