Continuous film spin-orbit torque characterization via four probe measurement

Continuous film spin-orbit torque characterization via four probe measurement

Spin-orbit torque (SOT) characterization techniques generally require the Hall cross that generally demands lithography resources and time. It is highly desirable to characterize SOT efficiencies with minimal sample processing time. Here, we demonstrate a lithography-free technique to determine the...

תיאור מלא

מידע ביבליוגרפי
Main Authors:	Poh, Han Yin, Ang, Calvin Ching Ian, Jin, Tianli, Tan, Funan, Lim, Gerard Joseph, Wu, Shuo, Poh, Francis, Lew, Wen Siang
מחברים אחרים:	School of Physical and Mathematical Sciences
פורמט:	Journal Article
שפה:	English
יצא לאור:	2022
נושאים:	Science::Physics Spin-Orbit Torque Lithography
גישה מקוונת:	https://hdl.handle.net/10356/161223

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