Crack problems in thin-layered structures

Thin-layered structures are used in a variety of applications today. Prevention of failure of these structures is important by identify the integrity or strength of these structures. The thickness of the crack residing layer, the distance from crack to the layers interface and elastic modulus mismat...

Fuld beskrivelse

Bibliografiske detaljer
Hovedforfatter: Lai, Alvin Junqi
Andre forfattere: Xiao Zhongmin
Format: Final Year Project (FYP)
Sprog:English
Udgivet: 2009
Fag:
Online adgang:http://hdl.handle.net/10356/16166