Machine learning approach for wafer frontend test yield loss prediction
Nowadays, as automation and digitalization are deeply integrated into the semiconductor industry, a tremendous amount of data generated from IC Design to Final Test plays a vital role in boosting innovation and productivity. The interval time between fabrication and testing could be a few weeks...
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| Format: | Thesis-Master by Coursework |
| Language: | English |
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Nanyang Technological University
2023
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| Online Access: | https://hdl.handle.net/10356/166864 |