Circuits for security

Internet of things (IOT) usage has been on the rise and will continue to increase as technology improves. This gives rise to a need for better security for the vulnerable IOT. Physical unclonable function (PUF) is one of the techniques that are being used to provide security and SRAM PUF is one of t...

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Bibliographic Details
Main Author: Muhammad Aznin Bin Abdul Aziz
Other Authors: Kim Tae Hyoung
Format: Final Year Project (FYP)
Language:English
Published: Nanyang Technological University 2023
Subjects:
Online Access:https://hdl.handle.net/10356/167767
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author Muhammad Aznin Bin Abdul Aziz
author2 Kim Tae Hyoung
author_facet Kim Tae Hyoung
Muhammad Aznin Bin Abdul Aziz
author_sort Muhammad Aznin Bin Abdul Aziz
collection NTU
description Internet of things (IOT) usage has been on the rise and will continue to increase as technology improves. This gives rise to a need for better security for the vulnerable IOT. Physical unclonable function (PUF) is one of the techniques that are being used to provide security and SRAM PUF is one of the preferred type of PUF. While being a storage memory, it can simultaneously be used as part of a security system without requiring additional component on the device. Effect of process, voltage and temperature (PVT) on SRAM PUF will be studied and novel idea(s) will be proposed to counter the effect that can degrade the SRAM PUF reliability.
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spelling ntu-10356/1677672023-07-07T18:06:42Z Circuits for security Muhammad Aznin Bin Abdul Aziz Kim Tae Hyoung School of Electrical and Electronic Engineering THKIM@ntu.edu.sg Engineering::Electrical and electronic engineering Internet of things (IOT) usage has been on the rise and will continue to increase as technology improves. This gives rise to a need for better security for the vulnerable IOT. Physical unclonable function (PUF) is one of the techniques that are being used to provide security and SRAM PUF is one of the preferred type of PUF. While being a storage memory, it can simultaneously be used as part of a security system without requiring additional component on the device. Effect of process, voltage and temperature (PVT) on SRAM PUF will be studied and novel idea(s) will be proposed to counter the effect that can degrade the SRAM PUF reliability. Bachelor of Engineering (Electrical and Electronic Engineering) 2023-06-04T12:46:44Z 2023-06-04T12:46:44Z 2023 Final Year Project (FYP) Muhammad Aznin Bin Abdul Aziz (2023). Circuits for security. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/167767 https://hdl.handle.net/10356/167767 en A2159-221 application/pdf Nanyang Technological University
spellingShingle Engineering::Electrical and electronic engineering
Muhammad Aznin Bin Abdul Aziz
Circuits for security
title Circuits for security
title_full Circuits for security
title_fullStr Circuits for security
title_full_unstemmed Circuits for security
title_short Circuits for security
title_sort circuits for security
topic Engineering::Electrical and electronic engineering
url https://hdl.handle.net/10356/167767
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