Revolutionizing X-ray technology through the power of computer algorithm
This study proposes an X-ray mirror of high reflectivity with multilayer structure based on X-ray reflectivity data measured. Today, a vast range of applications, including medicine, biomedical research, microscopy, airport security, quality control, and manufacturing, among others, all depend on X-...
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Format: | Final Year Project (FYP) |
Language: | English |
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Nanyang Technological University
2023
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Online Access: | https://hdl.handle.net/10356/167927 |
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author | Anil, Arya |
author2 | Wong Liang Jie |
author_facet | Wong Liang Jie Anil, Arya |
author_sort | Anil, Arya |
collection | NTU |
description | This study proposes an X-ray mirror of high reflectivity with multilayer structure based on X-ray reflectivity data measured. Today, a vast range of applications, including medicine, biomedical research, microscopy, airport security, quality control, and manufacturing, among others, all depend on X-ray technology. The reflectivity of X-rays is not the same way as photons. Different type of superlattices materials is simulated to achieve high reflectivity. Si -SiO2 and Si -GaAs are the two sets of multiple layers are tested within the Hard X-rays and Soft X-rays wavelength range. X-ray Reflectivity method helps to analyse the effect of different properties of a layer on reflectivity. Transfer Matrix method is simulated in MATLAB App designer using the materials to calculate the reflectance of a multilayer. This algorithm helps to design mirrors based on the different layers’ parameters obtained in the simulation. |
first_indexed | 2025-02-19T03:34:25Z |
format | Final Year Project (FYP) |
id | ntu-10356/167927 |
institution | Nanyang Technological University |
language | English |
last_indexed | 2025-02-19T03:34:25Z |
publishDate | 2023 |
publisher | Nanyang Technological University |
record_format | dspace |
spelling | ntu-10356/1679272023-07-07T15:44:32Z Revolutionizing X-ray technology through the power of computer algorithm Anil, Arya Wong Liang Jie School of Electrical and Electronic Engineering liangjie.wong@ntu.edu.sg Engineering::Electrical and electronic engineering This study proposes an X-ray mirror of high reflectivity with multilayer structure based on X-ray reflectivity data measured. Today, a vast range of applications, including medicine, biomedical research, microscopy, airport security, quality control, and manufacturing, among others, all depend on X-ray technology. The reflectivity of X-rays is not the same way as photons. Different type of superlattices materials is simulated to achieve high reflectivity. Si -SiO2 and Si -GaAs are the two sets of multiple layers are tested within the Hard X-rays and Soft X-rays wavelength range. X-ray Reflectivity method helps to analyse the effect of different properties of a layer on reflectivity. Transfer Matrix method is simulated in MATLAB App designer using the materials to calculate the reflectance of a multilayer. This algorithm helps to design mirrors based on the different layers’ parameters obtained in the simulation. Bachelor of Engineering (Electrical and Electronic Engineering) 2023-06-05T05:25:51Z 2023-06-05T05:25:51Z 2023 Final Year Project (FYP) Anil, A. (2023). Revolutionizing X-ray technology through the power of computer algorithm. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/167927 https://hdl.handle.net/10356/167927 en P2035-212 application/pdf Nanyang Technological University |
spellingShingle | Engineering::Electrical and electronic engineering Anil, Arya Revolutionizing X-ray technology through the power of computer algorithm |
title | Revolutionizing X-ray technology through the power of computer algorithm |
title_full | Revolutionizing X-ray technology through the power of computer algorithm |
title_fullStr | Revolutionizing X-ray technology through the power of computer algorithm |
title_full_unstemmed | Revolutionizing X-ray technology through the power of computer algorithm |
title_short | Revolutionizing X-ray technology through the power of computer algorithm |
title_sort | revolutionizing x ray technology through the power of computer algorithm |
topic | Engineering::Electrical and electronic engineering |
url | https://hdl.handle.net/10356/167927 |
work_keys_str_mv | AT anilarya revolutionizingxraytechnologythroughthepowerofcomputeralgorithm |