Analog smart I/O pads
Electrostatic discharge (ESD) is one of the leading causes of microchip failure during manufacture as well as field and consumer use [National Semiconductor Corporation]. ESD is an increasingly significant problem in integrated circuit design as increasing pin counts and faster circuit speeds compou...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/10356/16924 |