Machine learning based image analysis for surface defect detection
The progressive and intelligent advancement of the manufacturing industry demands precise quality control to ensure product excellence. The surface defects that arise during the manufacturing processes pose significant concern as they can lead to quality issues and compromise production integrity...
Main Author: | Htet Thiri Zaw |
---|---|
Other Authors: | Zheng Jianmin |
Format: | Final Year Project (FYP) |
Language: | English |
Published: |
Nanyang Technological University
2024
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Subjects: | |
Online Access: | https://hdl.handle.net/10356/175366 |
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