Conductive bridge random access memory

This research paper contains a background of the current memory devices and the working principles as well as their limitations. As there is a high data storage demand in the future, new emerging technology is required to increase the memory storage density and improve computing efficiency. It also...

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Main Author: Chia, Zong Xian
Other Authors: Ang Diing Shenp
Format: Final Year Project (FYP)
Language:English
Published: Nanyang Technological University 2024
Subjects:
Online Access:https://hdl.handle.net/10356/176617
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author Chia, Zong Xian
author2 Ang Diing Shenp
author_facet Ang Diing Shenp
Chia, Zong Xian
author_sort Chia, Zong Xian
collection NTU
description This research paper contains a background of the current memory devices and the working principles as well as their limitations. As there is a high data storage demand in the future, new emerging technology is required to increase the memory storage density and improve computing efficiency. It also includes a literature review on emerging devices with the potential to replace the current technologies with an in-depth discussion on Resistive Random Access Memory (RRAM) which is intensively being studied specifically the Conductive Bridge Random Access Memory (CBRAM). It also includes electrical characteristics studies on a CBRAM device that compromises a Metal-Insulator-Metal structure of Silver (Ag) as the active electrode, Titanium Nitride (TiN) and Germanium Sulfide (GeS) used for the switching layer and Platinum (Pt) for the counter electrode which seeks to comprehend the operating characteristics of this particular device with various DC measurements.
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spelling ntu-10356/1766172024-05-24T15:50:10Z Conductive bridge random access memory Chia, Zong Xian Ang Diing Shenp School of Electrical and Electronic Engineering EDSAng@ntu.edu.sg Engineering This research paper contains a background of the current memory devices and the working principles as well as their limitations. As there is a high data storage demand in the future, new emerging technology is required to increase the memory storage density and improve computing efficiency. It also includes a literature review on emerging devices with the potential to replace the current technologies with an in-depth discussion on Resistive Random Access Memory (RRAM) which is intensively being studied specifically the Conductive Bridge Random Access Memory (CBRAM). It also includes electrical characteristics studies on a CBRAM device that compromises a Metal-Insulator-Metal structure of Silver (Ag) as the active electrode, Titanium Nitride (TiN) and Germanium Sulfide (GeS) used for the switching layer and Platinum (Pt) for the counter electrode which seeks to comprehend the operating characteristics of this particular device with various DC measurements. Bachelor's degree 2024-05-18T12:15:15Z 2024-05-18T12:15:15Z 2024 Final Year Project (FYP) Chia, Z. X. (2024). Conductive bridge random access memory. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/176617 https://hdl.handle.net/10356/176617 en application/pdf Nanyang Technological University
spellingShingle Engineering
Chia, Zong Xian
Conductive bridge random access memory
title Conductive bridge random access memory
title_full Conductive bridge random access memory
title_fullStr Conductive bridge random access memory
title_full_unstemmed Conductive bridge random access memory
title_short Conductive bridge random access memory
title_sort conductive bridge random access memory
topic Engineering
url https://hdl.handle.net/10356/176617
work_keys_str_mv AT chiazongxian conductivebridgerandomaccessmemory