Anomaly detection for X-ray of PCB & IC images
This project investigates the use of deep learning models for defect detection in printed circuit boards and integrated circuits using YOLOv9. We developed a customized neural network model that take binary mask images and identifies defects in each image. The methodology included converting the dat...
| Egile nagusia: | |
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| Beste egile batzuk: | |
| Formatua: | Final Year Project (FYP) |
| Hizkuntza: | English |
| Argitaratua: |
Nanyang Technological University
2024
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| Gaiak: | |
| Sarrera elektronikoa: | https://hdl.handle.net/10356/177102 |