Taxonomy, clustering, and classification of integrated circuit image datasets for deep learning
In the ever-evolving landscape of the semiconductor industry, the integrity of Integrated Circuits (ICs) is critical to technological efficacy and advancement. As such, ensuring the quality of ICs is a high-stakes endeavour where accuracy and precision are paramount. This project introduces a compre...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2024
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| Online Access: | https://hdl.handle.net/10356/177344 |