Automated test point determination: characterization data vs product specifications
This abstract discusses the significance of achieving optimal testing programs in the context of AMD Singapore's New Product Integration (NPI) process, where product yield and quality are paramount concerns. The objective is to establish a realistic benchmark, known as the optimal test point...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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Nanyang Technological University
2024
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| Online Access: | https://hdl.handle.net/10356/178113 |
| _version_ | 1811679995692580864 |
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| author | Ku, Chantel Shi Ning |
| author2 | Gwee Bah Hwee |
| author_facet | Gwee Bah Hwee Ku, Chantel Shi Ning |
| author_sort | Ku, Chantel Shi Ning |
| collection | NTU |
| description | This abstract discusses the significance of achieving optimal testing programs in the
context of AMD Singapore's New Product Integration (NPI) process, where product yield
and quality are paramount concerns. The objective is to establish a realistic benchmark,
known as the optimal test point, which effectively differentiates between performing and
under-performing units without excessively impacting yield. The report emphasizes the
automation of this process, aiming to streamline and expedite the determination of the
optimal test point, previously performed manually. By automating this critical aspect,
significant time savings are anticipated, consequently reducing costs during the NPI
process. |
| first_indexed | 2024-10-01T03:18:01Z |
| format | Final Year Project (FYP) |
| id | ntu-10356/178113 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T03:18:01Z |
| publishDate | 2024 |
| publisher | Nanyang Technological University |
| record_format | dspace |
| spelling | ntu-10356/1781132024-06-07T15:42:21Z Automated test point determination: characterization data vs product specifications Ku, Chantel Shi Ning Gwee Bah Hwee School of Electrical and Electronic Engineering ebhgwee@ntu.edu.sg Engineering This abstract discusses the significance of achieving optimal testing programs in the context of AMD Singapore's New Product Integration (NPI) process, where product yield and quality are paramount concerns. The objective is to establish a realistic benchmark, known as the optimal test point, which effectively differentiates between performing and under-performing units without excessively impacting yield. The report emphasizes the automation of this process, aiming to streamline and expedite the determination of the optimal test point, previously performed manually. By automating this critical aspect, significant time savings are anticipated, consequently reducing costs during the NPI process. Bachelor's degree 2024-06-05T01:10:34Z 2024-06-05T01:10:34Z 2024 Final Year Project (FYP) Ku, C. S. N. (2024). Automated test point determination: characterization data vs product specifications. Final Year Project (FYP), Nanyang Technological University, Singapore. https://hdl.handle.net/10356/178113 https://hdl.handle.net/10356/178113 en A2077-231 application/pdf Nanyang Technological University |
| spellingShingle | Engineering Ku, Chantel Shi Ning Automated test point determination: characterization data vs product specifications |
| title | Automated test point determination: characterization data vs product specifications |
| title_full | Automated test point determination: characterization data vs product specifications |
| title_fullStr | Automated test point determination: characterization data vs product specifications |
| title_full_unstemmed | Automated test point determination: characterization data vs product specifications |
| title_short | Automated test point determination: characterization data vs product specifications |
| title_sort | automated test point determination characterization data vs product specifications |
| topic | Engineering |
| url | https://hdl.handle.net/10356/178113 |
| work_keys_str_mv | AT kuchantelshining automatedtestpointdeterminationcharacterizationdatavsproductspecifications |