Study on characterization and parameter extraction techniques for GaN high electron mobility transistors

In recent decades, environmental concerns and rising energy costs have brought to light the critical need for sophisticated power electronics and RF communication systems. GaN, a semiconductor material with a broad bandgap, is renowned for its exceptional physical characteristics, which render it ex...

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Bibliographic Details
Main Author: Cui, Pengju
Other Authors: Ng Geok Ing
Format: Thesis-Master by Coursework
Language:English
Published: Nanyang Technological University 2024
Subjects:
Online Access:https://hdl.handle.net/10356/178986

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