Development of nano-mechanical testing sytem for effective assessment of mechanical properties of perpendicular recording magnetic thin films

A magnetic recording disk coated with multilayer thin films is one of the most important components in a hard disk. Failure due to nano-scale scratches on the sputtered thin film layer has imposed a great concern on reliability of hard disk. This is due to the inherent weakness of the perpendicular...

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Bibliographic Details
Main Author: Zhou, Quan.
Other Authors: Sam Zhang Shanyong
Format: Thesis
Language:English
Published: 2009
Subjects:
Online Access:http://hdl.handle.net/10356/18857