Testing of memory devices : a case study
The project examines the testing of the EPROM devices (on wafer) carried out in a local multinational company, analyses the fault coverage and proposes methods to improve the test yield. Using actual test yield data obtained from the test floor, the project examines and proposes to remove the need f...
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| Format: | Thesis |
| Language: | English |
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2009
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| Online Access: | http://hdl.handle.net/10356/19611 |