Fabrication and characterization of microelectronic materials & devices (III)

Fabrication and characterization of microelectronic materials and devices.

Bibliographic Details
Main Author: Tse, Man Siu.
Other Authors: School of Electrical and Electronic Engineering
Format: Research Report
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/2705
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author Tse, Man Siu.
author2 School of Electrical and Electronic Engineering
author_facet School of Electrical and Electronic Engineering
Tse, Man Siu.
author_sort Tse, Man Siu.
collection NTU
description Fabrication and characterization of microelectronic materials and devices.
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format Research Report
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institution Nanyang Technological University
last_indexed 2024-10-01T07:35:57Z
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spelling ntu-10356/27052023-03-04T03:24:10Z Fabrication and characterization of microelectronic materials & devices (III) Tse, Man Siu. School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics Fabrication and characterization of microelectronic materials and devices. RGM 26/97 2008-09-17T09:13:21Z 2008-09-17T09:13:21Z 2000 2000 Research Report http://hdl.handle.net/10356/2705 Nanyang Technological University application/pdf
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Tse, Man Siu.
Fabrication and characterization of microelectronic materials & devices (III)
title Fabrication and characterization of microelectronic materials & devices (III)
title_full Fabrication and characterization of microelectronic materials & devices (III)
title_fullStr Fabrication and characterization of microelectronic materials & devices (III)
title_full_unstemmed Fabrication and characterization of microelectronic materials & devices (III)
title_short Fabrication and characterization of microelectronic materials & devices (III)
title_sort fabrication and characterization of microelectronic materials devices iii
topic DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
url http://hdl.handle.net/10356/2705
work_keys_str_mv AT tsemansiu fabricationandcharacterizationofmicroelectronicmaterialsdevicesiii