Internal microprobing at VLSI chips
Microprobing is the technique suitable to detect and measureinternal signals inside the VLSI chips. The setup comprises of a microprobing station, micromanipulators and probes. DC (static) and AC (dynamic) measurements on some VLSI chips to prove the establishment and application of microprobing tec...
| Main Authors: | , |
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| Other Authors: | |
| Format: | Research Report |
| Published: |
2008
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| Online Access: | http://hdl.handle.net/10356/3032 |
| _version_ | 1824454976742621184 |
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| author | Liu, Po Ching. Chin, Edward Hsi Ling. |
| author2 | School of Electrical and Electronic Engineering |
| author_facet | School of Electrical and Electronic Engineering Liu, Po Ching. Chin, Edward Hsi Ling. |
| author_sort | Liu, Po Ching. |
| collection | NTU |
| description | Microprobing is the technique suitable to detect and measureinternal signals inside the VLSI chips. The setup comprises of a microprobing station, micromanipulators and probes. DC (static) and AC (dynamic) measurements on some VLSI chips to prove the establishment and application of microprobing techniques are presented. |
| first_indexed | 2025-02-19T03:30:52Z |
| format | Research Report |
| id | ntu-10356/3032 |
| institution | Nanyang Technological University |
| last_indexed | 2025-02-19T03:30:52Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | ntu-10356/30322023-03-04T03:24:58Z Internal microprobing at VLSI chips Liu, Po Ching. Chin, Edward Hsi Ling. School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Microprobing is the technique suitable to detect and measureinternal signals inside the VLSI chips. The setup comprises of a microprobing station, micromanipulators and probes. DC (static) and AC (dynamic) measurements on some VLSI chips to prove the establishment and application of microprobing techniques are presented. RP 33/87 2008-09-17T09:19:14Z 2008-09-17T09:19:14Z 1990 1990 Research Report http://hdl.handle.net/10356/3032 Nanyang Technological University application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits Liu, Po Ching. Chin, Edward Hsi Ling. Internal microprobing at VLSI chips |
| title | Internal microprobing at VLSI chips |
| title_full | Internal microprobing at VLSI chips |
| title_fullStr | Internal microprobing at VLSI chips |
| title_full_unstemmed | Internal microprobing at VLSI chips |
| title_short | Internal microprobing at VLSI chips |
| title_sort | internal microprobing at vlsi chips |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Integrated circuits |
| url | http://hdl.handle.net/10356/3032 |
| work_keys_str_mv | AT liupoching internalmicroprobingatvlsichips AT chinedwardhsiling internalmicroprobingatvlsichips |