Control on yield variations between testers using monitoring-test
In order to monitor the yield variation, an automated Statistical Process Control (SPC) system is used, which applies Statistics to justify the process variation. This report introduces a new approach, called the MONITOR test as an alternative tool in the overall process control system.
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| Other Authors: | |
| Format: | Thesis |
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2008
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| Online Access: | http://hdl.handle.net/10356/3217 |
| _version_ | 1811679362776301568 |
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| author | Seshadri Raghavendra Murali. |
| author2 | Wang, Dan Wei |
| author_facet | Wang, Dan Wei Seshadri Raghavendra Murali. |
| author_sort | Seshadri Raghavendra Murali. |
| collection | NTU |
| description | In order to monitor the yield variation, an automated Statistical Process Control (SPC) system is used, which applies Statistics to justify the process variation. This report introduces a new approach, called the MONITOR test as an alternative tool in the overall process control system. |
| first_indexed | 2024-10-01T03:07:57Z |
| format | Thesis |
| id | ntu-10356/3217 |
| institution | Nanyang Technological University |
| last_indexed | 2024-10-01T03:07:57Z |
| publishDate | 2008 |
| record_format | dspace |
| spelling | ntu-10356/32172023-07-04T15:10:11Z Control on yield variations between testers using monitoring-test Seshadri Raghavendra Murali. Wang, Dan Wei School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation In order to monitor the yield variation, an automated Statistical Process Control (SPC) system is used, which applies Statistics to justify the process variation. This report introduces a new approach, called the MONITOR test as an alternative tool in the overall process control system. Master of Science (Computer Control and Automation) 2008-09-17T09:24:46Z 2008-09-17T09:24:46Z 2001 2001 Thesis http://hdl.handle.net/10356/3217 Nanyang Technological University application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation Seshadri Raghavendra Murali. Control on yield variations between testers using monitoring-test |
| title | Control on yield variations between testers using monitoring-test |
| title_full | Control on yield variations between testers using monitoring-test |
| title_fullStr | Control on yield variations between testers using monitoring-test |
| title_full_unstemmed | Control on yield variations between testers using monitoring-test |
| title_short | Control on yield variations between testers using monitoring-test |
| title_sort | control on yield variations between testers using monitoring test |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Control and instrumentation |
| url | http://hdl.handle.net/10356/3217 |
| work_keys_str_mv | AT seshadriraghavendramurali controlonyieldvariationsbetweentestersusingmonitoringtest |