Design optimization of low noise amplifier with electro-static discharge circuits

This dissertation presents the study of ESD-circuit interaction problems in radio frequency (RF) circuits. Electrostatic discharge (ESD) damage is well known for the current advanced integrated circuit (IC) technologies. A successful on-chip ESD protection circuit design should take a system approac...

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Bibliographic Details
Main Author: Tan, Chee Yuen.
Other Authors: Yeo, Kiat Seng
Format: Thesis
Published: 2008
Subjects:
Online Access:http://hdl.handle.net/10356/3334
Description
Summary:This dissertation presents the study of ESD-circuit interaction problems in radio frequency (RF) circuits. Electrostatic discharge (ESD) damage is well known for the current advanced integrated circuit (IC) technologies. A successful on-chip ESD protection circuit design should take a system approach in order to address the mutual influences between the ESD protection networks and the core circuit being protected.