Fabrication and characterization of InP/InGaAs Metamorphic heterojunction bipolar transistors (HBTs)

High gain metamorphic InP/InGaAs/InP DHBTs (double heterojunction bipolar transistors) on GaAs substrate fabricated using complete NTU in-house process have been demonstrated in this investigation. DC and RF characterization of various MHBTs (metamorphic HBTs), including noise and power measurements...

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Bibliografiske detaljer
Hovedforfatter: Yang, Hong
Andre forfattere: K. Radhakrishnan
Format: Thesis
Udgivet: 2008
Fag:
Online adgang:https://hdl.handle.net/10356/3833