Design and fabrication of surface micromachined microbolometer for IR image sensor

In this thesis, the integration of CMOS devices with microbolometer on the same silicon chip was studied. Silicon based materials Poly-Si and Poly-SiGe layers were deposited as the sensor films as well as the CMOS gate electrode. Microbolometer test structures and CMOS devices were fabricated using...

全面介绍

书目详细资料
主要作者: Yuan, Xiaohong.
其他作者: Tse, Man Siu
格式: Thesis
出版: 2008
主题:
在线阅读:http://hdl.handle.net/10356/3916
实物特征
总结:In this thesis, the integration of CMOS devices with microbolometer on the same silicon chip was studied. Silicon based materials Poly-Si and Poly-SiGe layers were deposited as the sensor films as well as the CMOS gate electrode. Microbolometer test structures and CMOS devices were fabricated using separately process flows.