Raman investigation of nitride and oxide films

Nanotechnology has been intensively studied on for creating many new materials and devices with a comprehensive range of applications, which consist of fields in medicine, electronics and energy production. Both oxides and nitrides have now become essentially important to most of the consumer produc...

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Main Author: Tan, Bennie Wei Zhong.
Other Authors: Sun Changqing
Format: Final Year Project (FYP)
Language:English
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/10356/40873
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author Tan, Bennie Wei Zhong.
author2 Sun Changqing
author_facet Sun Changqing
Tan, Bennie Wei Zhong.
author_sort Tan, Bennie Wei Zhong.
collection NTU
description Nanotechnology has been intensively studied on for creating many new materials and devices with a comprehensive range of applications, which consist of fields in medicine, electronics and energy production. Both oxides and nitrides have now become essentially important to most of the consumer products. Therefore, properties of oxides and nitrides are the area of interest. Characterization and determination of the metal oxides are done according to the bulk electronic and geometric properties which affect the surface properties of the metal oxides. While the properties of nitrides such as optical and structural make useful means for many applications by the nature of the chemical bond. Raman spectroscopy is used extensively for investigation of a material using means of visible light, near infrared or near ultraviolet source to attain information about the vibronic behaviour of the material. Raman scattering is the result of excitation of the material. Hence, two different forms of Raman transitions are created: stokes radiation and anti-Stokes radiation which also known as Red Shift scattered light and Blue Shift scattered light. In this report, it will comprise of the theoretical and practical analysis aspect to understand the vibration of the samples. It will be carried out with the help of the visible Raman spectroscopy that will determine the vibration excitation of the material in terms of the peak intensity. Thus combining both theoretical and practical approaches, the relationship between the Raman frequency shifting and size dependency of the material sample can therefore be determined.
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spelling ntu-10356/408732023-07-07T17:07:57Z Raman investigation of nitride and oxide films Tan, Bennie Wei Zhong. Sun Changqing School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Microelectronics Nanotechnology has been intensively studied on for creating many new materials and devices with a comprehensive range of applications, which consist of fields in medicine, electronics and energy production. Both oxides and nitrides have now become essentially important to most of the consumer products. Therefore, properties of oxides and nitrides are the area of interest. Characterization and determination of the metal oxides are done according to the bulk electronic and geometric properties which affect the surface properties of the metal oxides. While the properties of nitrides such as optical and structural make useful means for many applications by the nature of the chemical bond. Raman spectroscopy is used extensively for investigation of a material using means of visible light, near infrared or near ultraviolet source to attain information about the vibronic behaviour of the material. Raman scattering is the result of excitation of the material. Hence, two different forms of Raman transitions are created: stokes radiation and anti-Stokes radiation which also known as Red Shift scattered light and Blue Shift scattered light. In this report, it will comprise of the theoretical and practical analysis aspect to understand the vibration of the samples. It will be carried out with the help of the visible Raman spectroscopy that will determine the vibration excitation of the material in terms of the peak intensity. Thus combining both theoretical and practical approaches, the relationship between the Raman frequency shifting and size dependency of the material sample can therefore be determined. Bachelor of Engineering 2010-06-23T04:24:09Z 2010-06-23T04:24:09Z 2010 2010 Final Year Project (FYP) http://hdl.handle.net/10356/40873 en Nanyang Technological University 63 p. application/pdf
spellingShingle DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
Tan, Bennie Wei Zhong.
Raman investigation of nitride and oxide films
title Raman investigation of nitride and oxide films
title_full Raman investigation of nitride and oxide films
title_fullStr Raman investigation of nitride and oxide films
title_full_unstemmed Raman investigation of nitride and oxide films
title_short Raman investigation of nitride and oxide films
title_sort raman investigation of nitride and oxide films
topic DRNTU::Engineering::Electrical and electronic engineering::Microelectronics
url http://hdl.handle.net/10356/40873
work_keys_str_mv AT tanbennieweizhong ramaninvestigationofnitrideandoxidefilms