Characterization and reliability studies of oxides grown by wet and dry oxidations for 0.25 micrometer CMOS technology
The main focus of this report is to improve the hot-carrier lifetime of a 0.25 micrometer CMOS device.
Main Author: | Chow, Yew Tuck. |
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Other Authors: | Prasad, Krishnamachar |
Format: | Thesis |
Published: |
2008
|
Subjects: | |
Online Access: | http://hdl.handle.net/10356/4166 |
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