Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications.

Nanocomposite thin films of Si nanocrystals (nc-Si) embedded in SiO2 have attracted intensive research for potential applications in next generation non-volatile memory device as well as Si-compatible light-emitting devices. This dissertation studies the structural, electrical and optoelectronic pro...

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Bibliographic Details
Main Author: Zhang, Wali.
Other Authors: Sam Zhang Shanyong
Format: Thesis
Language:English
Published: 2011
Subjects:
Online Access:https://hdl.handle.net/10356/44687
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author Zhang, Wali.
author2 Sam Zhang Shanyong
author_facet Sam Zhang Shanyong
Zhang, Wali.
author_sort Zhang, Wali.
collection NTU
description Nanocomposite thin films of Si nanocrystals (nc-Si) embedded in SiO2 have attracted intensive research for potential applications in next generation non-volatile memory device as well as Si-compatible light-emitting devices. This dissertation studies the structural, electrical and optoelectronic properties of the Si nanocomposite films. The Si nanocomposite films are synthesized by reactive radio frequency magnetron sputtering of a Si target in a gas mixture of Ar/O2 followed by rapid thermal annealing at high temperatures. The synthesized films have been characterized with transmission electron microscopy (TEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), current-voltage (I-V), capacitance-voltage (C-V) and electroluminescence (EL). The as-sputtered SiOx films are amorphous. XPS analysis reveals that the as-deposited SiOx films contain five Si chemical states (Sin+, where n = 0, 1, 2, 3 and 4) in a wide composition range. Amorphous Si nanoclusters are formed in the as-deposited SiOx films, and they are embedded in the SiO2 matrix. The physical origin of the formation of the amorphous Si clusters is the high kinetic energy of the sputtered Si atoms coupled with high surface diffusivity. An atomic model has been proposed to depict the atomic structure of the amorphous SiOx films where Si nanocluster cores are encapsulated by shell of Si suboxides, which themselves embedded in the SiO2 matrix. Si nanocrystals are formed by rapid thermal annealing the as-deposited SiOx films at elevated temperatures. The growth mechanism of nc-Si is found to be different from the classical nucleation and diffusion growth model. It is believed that thermal segregation of the Si suboxides provides rapid growth of Si nanoclusters, thus is considered the responsible mechanism.
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spelling ntu-10356/446872023-03-11T17:49:18Z Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications. Zhang, Wali. Sam Zhang Shanyong School of Mechanical and Aerospace Engineering DRNTU::Engineering::Materials::Photonics and optoelectronics materials Nanocomposite thin films of Si nanocrystals (nc-Si) embedded in SiO2 have attracted intensive research for potential applications in next generation non-volatile memory device as well as Si-compatible light-emitting devices. This dissertation studies the structural, electrical and optoelectronic properties of the Si nanocomposite films. The Si nanocomposite films are synthesized by reactive radio frequency magnetron sputtering of a Si target in a gas mixture of Ar/O2 followed by rapid thermal annealing at high temperatures. The synthesized films have been characterized with transmission electron microscopy (TEM), Raman spectroscopy, X-ray photoelectron spectroscopy (XPS), current-voltage (I-V), capacitance-voltage (C-V) and electroluminescence (EL). The as-sputtered SiOx films are amorphous. XPS analysis reveals that the as-deposited SiOx films contain five Si chemical states (Sin+, where n = 0, 1, 2, 3 and 4) in a wide composition range. Amorphous Si nanoclusters are formed in the as-deposited SiOx films, and they are embedded in the SiO2 matrix. The physical origin of the formation of the amorphous Si clusters is the high kinetic energy of the sputtered Si atoms coupled with high surface diffusivity. An atomic model has been proposed to depict the atomic structure of the amorphous SiOx films where Si nanocluster cores are encapsulated by shell of Si suboxides, which themselves embedded in the SiO2 matrix. Si nanocrystals are formed by rapid thermal annealing the as-deposited SiOx films at elevated temperatures. The growth mechanism of nc-Si is found to be different from the classical nucleation and diffusion growth model. It is believed that thermal segregation of the Si suboxides provides rapid growth of Si nanoclusters, thus is considered the responsible mechanism. DOCTOR OF PHILOSOPHY (MAE) 2011-06-03T02:58:34Z 2011-06-03T02:58:34Z 2010 2010 Thesis Zhang, W. L. (2010). Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications. Doctoral thesis, Nanyang Technological University, Singapore. https://hdl.handle.net/10356/44687 10.32657/10356/44687 en 195 p. application/pdf
spellingShingle DRNTU::Engineering::Materials::Photonics and optoelectronics materials
Zhang, Wali.
Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications.
title Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications.
title_full Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications.
title_fullStr Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications.
title_full_unstemmed Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications.
title_short Magnetron sputtered nanocomposite films of SI nanocrystals embedded in SIO2 for electronic and optoelectronic applications.
title_sort magnetron sputtered nanocomposite films of si nanocrystals embedded in sio2 for electronic and optoelectronic applications
topic DRNTU::Engineering::Materials::Photonics and optoelectronics materials
url https://hdl.handle.net/10356/44687
work_keys_str_mv AT zhangwali magnetronsputterednanocompositefilmsofsinanocrystalsembeddedinsio2forelectronicandoptoelectronicapplications