Scanning near-field infrared microscopy
The main purpose of this final year project is to setup a Near-field Infrared Microscopy (SNIM) and to obtain a SNIM image with lateral resolution of 100nm. This is then reinforced by material characterization in term of nano scales with the use of infrared technology. The approach is to firs...
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| Format: | Final Year Project (FYP) |
| Language: | English |
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2011
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| Online Access: | http://hdl.handle.net/10356/45465 |
| _version_ | 1811689401558761472 |
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| author | Chua, Alvin Rui Song. |
| author2 | School of Electrical and Electronic Engineering |
| author_facet | School of Electrical and Electronic Engineering Chua, Alvin Rui Song. |
| author_sort | Chua, Alvin Rui Song. |
| collection | NTU |
| description | The main purpose of this final year project is to setup a Near-field Infrared Microscopy (SNIM) and to obtain a SNIM image with lateral resolution of 100nm. This is then reinforced by material characterization in term of nano scales with the use of infrared technology.
The approach is to first focus on the fundamental of Atomic Force Microscopy (AFM) in order to measure and control the distance between the tip and sample. After which is the probe fabrication process whereby the heating and pulling technique is selected to fabricate the probe. Upon the complete fabrication of the probe, the Scanning Near-field Optical Microscopy (SNOM) was then setup to show the characteristic of visible light. The SNOM setup was then modified and changed to a SNIM setup. |
| first_indexed | 2024-10-01T05:47:31Z |
| format | Final Year Project (FYP) |
| id | ntu-10356/45465 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2024-10-01T05:47:31Z |
| publishDate | 2011 |
| record_format | dspace |
| spelling | ntu-10356/454652023-07-07T16:12:58Z Scanning near-field infrared microscopy Chua, Alvin Rui Song. School of Electrical and Electronic Engineering Wang Qi Jie DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials The main purpose of this final year project is to setup a Near-field Infrared Microscopy (SNIM) and to obtain a SNIM image with lateral resolution of 100nm. This is then reinforced by material characterization in term of nano scales with the use of infrared technology. The approach is to first focus on the fundamental of Atomic Force Microscopy (AFM) in order to measure and control the distance between the tip and sample. After which is the probe fabrication process whereby the heating and pulling technique is selected to fabricate the probe. Upon the complete fabrication of the probe, the Scanning Near-field Optical Microscopy (SNOM) was then setup to show the characteristic of visible light. The SNOM setup was then modified and changed to a SNIM setup. Bachelor of Engineering 2011-06-14T01:46:29Z 2011-06-14T01:46:29Z 2011 2011 Final Year Project (FYP) http://hdl.handle.net/10356/45465 en Nanyang Technological University 65 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials Chua, Alvin Rui Song. Scanning near-field infrared microscopy |
| title | Scanning near-field infrared microscopy |
| title_full | Scanning near-field infrared microscopy |
| title_fullStr | Scanning near-field infrared microscopy |
| title_full_unstemmed | Scanning near-field infrared microscopy |
| title_short | Scanning near-field infrared microscopy |
| title_sort | scanning near field infrared microscopy |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Electronic apparatus and materials |
| url | http://hdl.handle.net/10356/45465 |
| work_keys_str_mv | AT chuaalvinruisong scanningnearfieldinfraredmicroscopy |