Scanning near-field infrared microscopy
The main purpose of this final year project is to setup a Near-field Infrared Microscopy (SNIM) and to obtain a SNIM image with lateral resolution of 100nm. This is then reinforced by material characterization in term of nano scales with the use of infrared technology. The approach is to firs...
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| 格式: | Final Year Project (FYP) |
| 语言: | English |
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2011
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| 在线阅读: | http://hdl.handle.net/10356/45465 |