High performance nano-scale measurements by advanced atomic force estimation
Atomic force microscopy (AFM) was invented by G. Binnig and his collaborators in 1986 after the invention of scanning tunnelling microscopy (STM) in the early 1980s. The AFM system deploys a tiny probe to interact with the sample such that topography information of the sample can be obtained. The re...
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| Format: | Thesis |
| Language: | English |
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2011
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| Online Access: | https://hdl.handle.net/10356/46322 |
| _version_ | 1824454493707698176 |
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| author | Cui, Song |
| author2 | Lim Ser Yong |
| author_facet | Lim Ser Yong Cui, Song |
| author_sort | Cui, Song |
| collection | NTU |
| description | Atomic force microscopy (AFM) was invented by G. Binnig and his collaborators in 1986 after the invention of scanning tunnelling microscopy (STM) in the early 1980s. The AFM system deploys a tiny probe to interact with the sample such that topography information of the sample can be obtained. The resolutions of the AFM topography images are in the nanometer scale and they are limited only by the probe diameters. Besides, in AFM imaging, there is no requirement on sample preparation and conductivity. Thus, the AFM provides an easy platform to observe, measure and manipulate atomic interactions. Since its invention, AFM has become an indispensable tool in the research areas of material sciences and biological sciences. The AFM is also widely used in many industry applications in microelectronics and data storage. Although many research areas and industry applications have benefited from the success of AFM, there is still an urgent need to improve the measurement resolution and accuracy of the AFM in order to further exploit the atomic characteristics at the scales of atoms or even smaller. In addition, AFM has been modified as a Casimir oscillator to study quantum fluctuations where highly accurate and precise measurement is also desired. Driven by this motivation, this thesis will focus on the improvement of accuracy and resolution of the AFM and its modified system, the Casimir oscillator. |
| first_indexed | 2025-02-19T03:23:12Z |
| format | Thesis |
| id | ntu-10356/46322 |
| institution | Nanyang Technological University |
| language | English |
| last_indexed | 2025-02-19T03:23:12Z |
| publishDate | 2011 |
| record_format | dspace |
| spelling | ntu-10356/463222023-07-04T16:16:09Z High performance nano-scale measurements by advanced atomic force estimation Cui, Song Lim Ser Yong Soh Yeng Chai School of Electrical and Electronic Engineering DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics Atomic force microscopy (AFM) was invented by G. Binnig and his collaborators in 1986 after the invention of scanning tunnelling microscopy (STM) in the early 1980s. The AFM system deploys a tiny probe to interact with the sample such that topography information of the sample can be obtained. The resolutions of the AFM topography images are in the nanometer scale and they are limited only by the probe diameters. Besides, in AFM imaging, there is no requirement on sample preparation and conductivity. Thus, the AFM provides an easy platform to observe, measure and manipulate atomic interactions. Since its invention, AFM has become an indispensable tool in the research areas of material sciences and biological sciences. The AFM is also widely used in many industry applications in microelectronics and data storage. Although many research areas and industry applications have benefited from the success of AFM, there is still an urgent need to improve the measurement resolution and accuracy of the AFM in order to further exploit the atomic characteristics at the scales of atoms or even smaller. In addition, AFM has been modified as a Casimir oscillator to study quantum fluctuations where highly accurate and precise measurement is also desired. Driven by this motivation, this thesis will focus on the improvement of accuracy and resolution of the AFM and its modified system, the Casimir oscillator. DOCTOR OF PHILOSOPHY (EEE) 2011-11-30T04:10:53Z 2011-11-30T04:10:53Z 2010 2010 Thesis Cui, S. (2010). High performance nano-scale measurements by advanced atomic force estimation. Doctoral thesis, Nanyang Technological University, Singapore. https://hdl.handle.net/10356/46322 10.32657/10356/46322 en 180 p. application/pdf |
| spellingShingle | DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics Cui, Song High performance nano-scale measurements by advanced atomic force estimation |
| title | High performance nano-scale measurements by advanced atomic force estimation |
| title_full | High performance nano-scale measurements by advanced atomic force estimation |
| title_fullStr | High performance nano-scale measurements by advanced atomic force estimation |
| title_full_unstemmed | High performance nano-scale measurements by advanced atomic force estimation |
| title_short | High performance nano-scale measurements by advanced atomic force estimation |
| title_sort | high performance nano scale measurements by advanced atomic force estimation |
| topic | DRNTU::Engineering::Electrical and electronic engineering::Nanoelectronics |
| url | https://hdl.handle.net/10356/46322 |
| work_keys_str_mv | AT cuisong highperformancenanoscalemeasurementsbyadvancedatomicforceestimation |